# positions[].organizations[].label
Institute for Engineering Education and Innovation

# positions[].organizations[].parent[].label
Texas A&M Engineering Experiment Station (TEES)

# keywords[]
4009 Electronics, Sensors And Digital Hardware

# educationAndTraining[].organization.label
University of Louisiana at Lafayette - (Lafayette, Louisiana, United States)

# educationAndTraining[].organization.label
University of Louisiana at Lafayette - (Lafayette, Louisiana, United States)

# awardsAndHonors[].label
Provost Academic Professional Track Faculty Teaching Excellence Award

# publications[].label
Transaction Level Stimulus Optimization in Functional Verification Using Machine Learning Predictors

# publications[].publisher
Institute of Electrical and Electronics Engineers (IEEE)

# publications[].label
Image segmentation on a 2D array by a directed split and merge procedure

# publications[].publisher
Institute of Electrical and Electronics Engineers (IEEE)

# publications[].label
A generalized Poisson based model for defect spatial distribution in WSI

# publications[].label
Parameterized modeling of open-circuit critical volume for three-dimensional defects in VLSI processing

# publications[].label
Three-dimensional defect sensitivity modeling for open circuits in ULSI structures

# publications[].publisher
Institute of Electrical and Electronics Engineers (IEEE)

# publications[].label
Defect clustering viewed through generalized Poisson distribution

# publications[].publisher
Institute of Electrical and Electronics Engineers (IEEE)

# publications[].label
Post-processing algorithm for short-circuit defect sensitivity reduction in VLSI layouts

# publications[].label
Yield modeling for fault tolerant WSI arrays

# publications[].label
Yield enhancement in the routing phase of integrated circuit layout synthesis

# publications[].label
Systolic array implementation of image segmentation by a directed split and merge procedure

# publications[].label
TheHuzz: Instruction Fuzzing of Processors Using Golden-Reference Models for Finding Software-Exploitable Vulnerabilities

# publications[].label
The nature of defect patterns on integrated-circuit wafer maps

# publications[].publisher
Institute of Electrical and Electronics Engineers (IEEE)

# publications[].label
A systolic array for image segmentation using split and merge procedure

# publications[].label
Parallel implementation of a cut and paste maze routing algorithm

# streetAddress
Texas A&M University; Computer Science & Engineering; 3112 TAMU

# organizations[]
Institute for Engineering Education and Innovation

# organizations[]
Texas A&M Engineering Experiment Station (TEES)

# schools[]
Texas A&M Engineering Experiment Station (TEES)

# etdChairOf[].label
Ray, Jaideep (2016-05). SketchSeeker : Finding Similar Sketches. Master's Thesis.